FEATURES
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Low limits of detection (LODs) for light elements including C, Be, Mg and others;
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No X-ray - free from the ionizing radiation hazard;
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Argon-free operation without an inert gas and other consumables;
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Automated metal base selection;
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Own well-developed analytics for LIBS;
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Easy-to-use: no complicated preparation or knowledge of spectroscopy required;
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The availability of chemical analysis in a small spot of surface and the smallest components (spot of analysis is less than 200 µm).
Handheld elemental analyzer ELANIK uses Laser-Induced Breakdown Spectrometry (LIBS) method which theoretically allows analysis of all the elements without complex preparation of the sample, on any material.
Being a portable handheld device (weight ~ 2 kg), ELANIK combines high analysis sensitivity and the ability to measure ultralight elements (C, Be and others) of optical emission spectrometers and the convenience of using X-ray analyzers. At the same time, the device is devoid of drawbacks of both of them - it does not require the use of inert gas, consumables and highly qualified specialists, and also does not have restrictions associated with the use of X-rays.
Among the laser handheld analyzers on the market, ELANIK is distinguished by the best ratio of price and quality of analysis.
EASY TO USE
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Analysis in the air: no inert gas required.
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Built-in video camera - it is convenient to choose the place of analysis on the sample.
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Ease of use - the elemental composition on the display as the final result of the analysis. No training and knowledge of spectroscopy required.
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Built-in alloy library: automatic determination of the alloy grade according to analysis results.
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Possibility to analyze small samples: analysis area is less than 0.3 mm.
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High reliability: device doesn’t contain elements requiring periodical replacement or maintenance.
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Laser surface cleaning - automatic sample preparation in many cases eliminates the need for a grinding tool.
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Automatic averaging of several measurements allows increasing the accuracy of the results, avoiding the influence of uneven distribution of elements.
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Saving measurement data in the device’s internal memory.